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Thickness dependent studies of dielectric breakdown in Langmuir thin molecular films

✍ Scribed by V.K. Agarwal; V.K. Srivastava

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 440 KB
Volume: 12
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(73)90088-4

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