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Studies on the thickness-dependent photofield effect in amorphous hydrogenated silicon thin films

โœ Scribed by V. Jayan; L.P. Lailamoni; K.J. Thomas; J. Majhi; P.R. Vaya


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
308 KB
Volume
198
Category
Article
ISSN
0040-6090

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Experimental techniques used to measure structural parameters of thin films such as thickness, density, and coverage provide important insights into the physical properties of these films. Structural parameters are also often used to predict the eventual performance of thin films. In this study, we