A theoretical derivation of the log-normal distribution of time-dependent dielectric breakdown in thin oxides

✍ Scribed by Yuh Yaw; R.S. Muller

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 561 KB
• Volume: 32
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(89)90110-x