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A theoretical derivation of the log-normal distribution of time-dependent dielectric breakdown in thin oxides : Yuh Yaw and R. S. Muller. Solid-St. Electron. 32(7), 541 (1989)


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
128 KB
Volume
30
Category
Article
ISSN
0026-2714

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