Fracture-like nature of defects in the time-dependent dielectric breakdown of metal-oxide-semiconductor capacitors

✍ Scribed by R.K. Bhan; S.K. Lomash; P.C. Mathur

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 249 KB
• Volume: 189
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(90)90024-8