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Charge generation in thin SiO2 polysilicon-gate MOS capacitors : P. Fazan, M. Dutoit, C. Martin and M. Ilegems. Solid-St. Electron.30, 829 (1987)


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
132 KB
Volume
28
Category
Article
ISSN
0026-2714

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