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Characterization of InGaAs/InP Single Quantum Well Structures by Rutherford Backscattering Spectrometry

✍ Scribed by Flagmeyer, R. ;Krause, H. ;Oelgart, G. ;Rohde, G.

Book ID: 105382545
Publisher: John Wiley and Sons
Year: 1991
Tongue: English
Weight: 383 KB
Volume: 124
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211240125

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