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Characterization of MOCVD Grown (Al, Ga)As/GaAs Single Quantum Well Structures by Rutherford Backscattering and Photoluminescence Spectroscopy

✍ Scribed by Flagmeyer, R. ;Oelgart, G. ;Kreher, K. ;Schwabe, R. ;Bugge, F. ;Lehmann, L. ;Jacobs, K.

No coin nor oath required. For personal study only.

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