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Characterization of Conducting Atomic Force Microscopy for Use With Magnetic Tunnel Junctions

โœ Scribed by Evarts, E.R.; Limin Cao; Ricketts, D.S.; Rizzo, N.D.; Bain, J.A.; Majetich, S.A.

Book ID
114653770
Publisher
IEEE
Year
2010
Tongue
English
Weight
465 KB
Volume
46
Category
Article
ISSN
0018-9464

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