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Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy

✍ Scribed by Chia Min Chang; Yen Ju Liu; Ming Lun Tseng; Nien-Nan Chu; Ding-Wei Huang; Masud Mansuripur; Din Ping Tsai

No coin nor oath required. For personal study only.

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