Nanoscale observations of the operational failure for phase-change-type nonvolatile memory devices using Ge2Sb2Te5 chalcogenide thin films

✍ Scribed by Sung-Min Yoon; Kyu-Jeong Choi; Nam-Yeal Lee; Seung-Yun Lee; Young-Sam Park; Byoung-Gon Yu

• Book ID: 108060333
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 588 KB
• Volume: 254
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2007.07.098