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Simplified tunnelling current calculation for MOS structures with ultra-thin oxides for conductive atomic force microscopy investigations

✍ Scribed by Werner Frammelsberger; Guenther Benstetter; Richard Stamp; Janice Kiely; Thomas Schweinboeck


Book ID
103843183
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
196 KB
Volume
116
Category
Article
ISSN
0921-5107

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