Local current distribution and electrical properties of a magnetic tunnel junction using conducting atomic force microscopy

✍ Scribed by Canizo-Cabrera, A.; Li, S.C.; Min-Fong Shu; Jia-Mou Lee; Garcia-Vazquez, V.; Chen, C.C.; Wu, J.C.; Takahashi, M.; Te-Ho Wu

• Book ID: 114649921
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 435 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2004.842080