Atomic force microscopy used for the surface characterization of microcapsule immunoisolation devices
β Scribed by Xu, Keyang ;Hercules, David M. ;Lacik, Igor ;Wang, Taylor G.
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 657 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0021-9304
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β¦ Synopsis
The surface morphology of the microcapsule used as a bioartificial pancreas was examined by atomic force microscopy (AFM) under ambient conditions in a liquid environment. The standard contact mode was used for imaging. The capsules exhibited different morphologies and surface roughness depending on the composition of the cation solution: namely, the mole ratio of antigelling and gelling cations [Na + ]/[Ca 2+ ]. Surface roughness parameters obtained by AFM measurements provide quantitative informa-tion on the surface properties of the capsular membrane. In this respect, AFM can be considered a valuable technique complementary to optical microscopy in providing feedback for capsule optimization.
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