✦ LIBER ✦

Erratum: Neethirajan et al., Characterization of the Surface Morphology of Durum Wheat Starch Granules Using Atomic Force Microscopy. Microscopy Research and Technique 71:125–132.

Publisher: John Wiley and Sons
Year: 2008
Tongue: English
Weight: 25 KB
Volume: 71
Category: Article
ISSN: 1059-910X
DOI: 10.1002/jemt.20554

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✦ Synopsis

Several inaccuracies were discovered in the publication of the above article.

The caption to Figure 2 should read ''AFM images of pure Spurr's resin samples. Scan size area of the image is (80 lm) 2 .''

The caption to Figure 5 should read ''AFM image of durum wheat vitreous starch granule surfaces after UV/ozone treatment for 30 s for a (50 lm) 2 scan area.''

📜 SIMILAR VOLUMES

Characterization of the surface morpholo

Characterization of the surface morphology of durum wheat starch granules using atomic force microscopy

✍ S. Neethirajan; D.J. Thomson; D.S. Jayas; N.D.G. White 📂 Article 📅 2008 🏛 John Wiley and Sons 🌐 English ⚖ 619 KB

## Abstract Knowledge of the structure and properties of microscopic surfaces of durum wheat starch granules is essential for understanding the functional and physico‐chemical properties. The nanoscale surface undulations on the starch granules inside durum wheat macroscopically influence the milli