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Characteristics of intermetallics and micromechanical properties during thermal ageing of Sn–Ag–Cu flip-chip solder interconnects

✍ Scribed by Dezhi Li; Changqing Liu; Paul P. Conway


Book ID
104061005
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
811 KB
Volume
391
Category
Article
ISSN
0921-5093

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