Atomic Layer Deposition of Hafnium and Z
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Hausmann, Dennis M.; Kim, Esther; Becker, Jill; Gordon, Roy G.
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Article
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2002
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American Chemical Society
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English
β 248 KB
Atomic layer deposition (ALD) of smooth and highly conformal films of hafnium and zirconium oxides was studied using six metal alkylamide precursors for hafnium and zirconium. Water was used as an oxygen source during these experiments. As deposited, these films exhibited a smooth surface with a mea