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An X-ray fluorescence method of analysing thin films of indium antimonide

✍ Scribed by R.H. Hartley

Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
469 KB
Volume
48
Category
Article
ISSN
0040-6090

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We have measured Au and Ni thin films on a quartz glass using both scanning tunnelling microscopy (STM) and glancing-incidence and -take-off x-ray fluorescence (GIT-XRF). The STM image shows that the film surface consists of grains of several tens of nanometres in size. Although the GIT-XRF method u