Quantitative X-ray fluorescence analysis of boron in thin films of borophosphosilicate glasses
✍ Scribed by M. Schuster; L. Müller; K.E. Mauser; R. Straub
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 488 KB
- Volume
- 157
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t