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Quantitative X-ray fluorescence analysis of single-layer and multilayer thin films

✍ Scribed by T.C. Huang

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 414 KB
Volume: 157
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(88)90009-0

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