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Thickness measurements of single and composite thin metal films using the X-ray fluorescence technique

โœ Scribed by S. Priyokumar Singh; D.K. Kaushik; S.K. Chattopadhyaya; N. Nath


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
252 KB
Volume
59
Category
Article
ISSN
0040-6090

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