Surface analysis of thick gold films by X-ray fluorescence using the base metal as an internal reference

✍ Scribed by Ronald Lee Foster; Peter F. Lott

• Publisher: Elsevier Science
• Year: 1980
• Tongue: English
• Weight: 161 KB
• Volume: 25
• Category: Article
• ISSN: 0026-265X
• DOI: 10.1016/0026-265x(80)90125-3