Rapid and accurate measurement of the thickness of thin films by an x-ray fluorescence technique using a new background subtraction method

✍ Scribed by R. Cirone; G.E. Gigante; G. Gualtieri; P. Picozzi; S. Santucci

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 268 KB
• Volume: 88
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(82)90353-4