✦ LIBER ✦
Determination of thin metal film thickness by x-ray diffractometry using the Scherrer equation, atomic absorption analysis and transmission/reflection visible spectroscopy
✍ Scribed by Alfred T. D'Agostino
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 625 KB
- Volume
- 262
- Category
- Article
- ISSN
- 0003-2670
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