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Quantitative electron probe x-ray microanalysis of thin films

✍ Scribed by S. Craig; G. Harding; D. Benson

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 187 KB
Volume: 100
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(83)90473-x

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