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Quantitative electron probe X-ray microanalysis of thin objects using an independent mass determination method

✍ Scribed by P.W.J. Linders; A.L.H. Stols; A.M. Stadhouders

Publisher: Elsevier Science
Year: 1981
Weight: 315 KB
Volume: 12
Category: Article
ISSN: 0047-7206
DOI: 10.1016/0047-7206(81)90013-3

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