✦ LIBER ✦

AES and SIMS profiling of buried silicide layers formed by 6 MeV high dose nickel implantation into silicon

✍ Scribed by A. Schönborn; J. K. N. Lindner; E. H. Kaat; H. Hubert; M. Grasserbauer; G. Friedbacher

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SIMS analysis of buried silicon nitride

✍ J.A. Kilner; R.J. Chater; P.L.F. Hemment; R.F. Peart; K.J. Reeson; R.P. Arrowsmi 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 418 KB

Optical and compositional studies of bur

✍ R.J. Chater; J.A. Kilner; E. Scheid; S. Cristoloveneau; P.L.F. Hemment; K.J. Ree 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 353 KB

The evolution of the Si/SiO2 interface i

✍ R.J. Chater; J.A. Kilner; P.L.F. Hemment; K.J. Reeson; J.R. Davis 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 308 KB

SIMS and 18O tracer studies of the redis

✍ J.A. Kilner; R.J. Chater; P.L.F. Hemment; R.F. Peart; E.A. Maydell-Ondrusz; M.R. 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 529 KB

A SIMS and TEM analysis of the growth me

✍ C.J. Griffin; J.A. Kilner; R.J. Chater; A. Staton-Bevan; K.J. Reeson; P.L.F. Hem 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 500 KB