## Abstract A method is described for the preparation of crossβsectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that
A technique for preparing the cross-section of proton-irradiated 316 stainless steel foils for transmission electron microscopy
β Scribed by R.A. Spurling; C.G. Rhodes
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 489 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0022-3115
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