## Abstract A method is described for the preparation of crossβsectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that
A method for preparing cross sections of films on wear surfaces for transmission electron microscopy study
β Scribed by Lewis K. Ives
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 447 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0043-1648
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