Thin film specimen preparation from bulk material a t a controlled depth below the surface and cross-section thin film preparation for transmission electron microscope investigations of electrically conducting materials are described. Both techniques are illustrated by austenitic stainless steel, wh
A stereo technique for measuring the depth of specimens in transmission electron microscopy
β Scribed by H.F. Premsela
- Publisher
- Elsevier Science
- Year
- 1976
- Weight
- 172 KB
- Volume
- 7
- Category
- Article
- ISSN
- 0047-7206
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