## Abstract A method is described for the preparation of crossโsectional samples of thin films for transmission electron microscopy. The technique produces larger amounts of thin region as compared with ion milling and eliminates the problems associated with ion beam damage. The requirement is that
A simple technique for the visualization of whole mount cytoskeletons with transmission electron microscopy
โ Scribed by Marek, Louis F. ;Kelley, Robert O.
- Publisher
- John Wiley and Sons
- Year
- 1983
- Tongue
- English
- Weight
- 870 KB
- Volume
- 207
- Category
- Article
- ISSN
- 0003-276X
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โฆ Synopsis
Abstract
Examination of whole mount cells in the transmission electron microscope has been useful in studies of cellular architecture. The common technique is to grow cells directly on formvarโcoated, gold grids for direct observation through a cell. We report a technique for obtaining whole mount preparations which requires neither fragile formvar films nor expensive, gold grids. Cells are grown on palladiumโcoated coverslips and processed for electron microscopy. The cells and the palladium substrate are separated from the coverslip. The cellโpalladium complex is then picked up on copper grids as in thin section processing. We compare images of the cytoskeleton using our technique with images using previously described techniques and present preliminary observations of contracting cell models. Such contractions would tear formvar films if attempted on cells grown in the conventional manner for whole mount examination. Our technique allows cells to contract without tearing the underlying substrate.
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