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A new I-V model for stress-induced leakage current including inelastic tunneling

✍ Scribed by Takagi, S.; Yasuda, N.; Toriumi, A.

Book ID: 114537556
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 225 KB
Volume: 46
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.740901

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