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A new two-trap tunneling model for the anomalous stress-induced leakage current (SILC) in Flash memories

✍ Scribed by D. Ielmini; A.S. Spinelli; A.L. Lacaita; A. Modelli


Book ID
104305627
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
298 KB
Volume
59
Category
Article
ISSN
0167-9317

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