Simulation of stress-induced leakage current in silicon dioxides: A modified trap-assisted tunneling model considering Gaussian-distributed traps and electron energy loss

✍ Scribed by Chang, Wai Jyh; Houng, Mau Phon; Wang, Yeong Her

• Book ID: 118278360
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 387 KB
• Volume: 89
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1367399