✦ LIBER ✦
Analytical modeling of stress-induced leakage currents in 5.1–9.6-nm-thick silicon-dioxide films based on two-step inelastic trap-assisted tunneling
✍ Scribed by Lenski, Markus; Endoh, Tetsuo; Masuoka, Fujio
- Book ID
- 118278359
- Publisher
- American Institute of Physics
- Year
- 2000
- Tongue
- English
- Weight
- 378 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0021-8979
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