A complete empirical large-signal model for the GaAs-and GaN-based HEMTs is presented. Three generalized drain current I-V models characterized by the multi-bias Pulsed I-V measurements are presented along with their dependence on temperature and quiescent bias state. The new I-V equations dedicated
β¦ LIBER β¦
A new empirical large-signal HEMT model
β Scribed by Shirakawa, K.; Shimizu, M.; Kawasaki, Y.; Ohashi, Y.; Okubo, N.
- Book ID
- 114552643
- Publisher
- IEEE
- Year
- 1996
- Tongue
- English
- Weight
- 293 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9480
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