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A new dynamical diffraction-based technique of residual stress measurements in thin films

✍ Scribed by M. Agamalian; E. Iolin; H. Kaiser; C. Rehm; S.A. Werner


Book ID
106024431
Publisher
Springer
Year
2002
Tongue
English
Weight
92 KB
Volume
74
Category
Article
ISSN
1432-0630

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✍ Da-Yong Qiao; Wei-Zheng Yuan; Yi-Ting Yu; Qing Liang; Zhi-Bo Ma; Xiao-Ying Li πŸ“‚ Article πŸ“… 2008 πŸ› Elsevier Science 🌐 English βš– 878 KB

The buckling method is presently one of the most commonly used methods in residual stress measurement, but still suffers from the problem that an array of structures occupying a large die area is required. In this paper, the buckling characteristics of annular thin plates were investigated and a new