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A comparison of surface roughness as measured by atomic force microscopy and x-ray scattering

✍ Scribed by Munkholm, A.; Brennan, S.; Carr, E. C.

Book ID: 126967446
Publisher: American Institute of Physics
Year: 1997
Tongue: English
Weight: 354 KB
Volume: 82
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.366129

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