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Atomic force microscopy and X-ray diffraction study of surface and interface roughness in Nb/Cu multilayers

✍ Scribed by K. Temst; M.J. Van Bael; D.G. de Groot; N.J. Koeman; R.P. Griessen; B. Wuyts; C. Van Haesendonck; Y. Bruynseraede

Book ID: 113321325
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 165 KB
Volume: 156
Category: Article
ISSN: 0304-8853
DOI: 10.1016/0304-8853(95)00806-3

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