𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Surface roughness in Langmuir-Blodgett multilayer films studied by AFM and X-ray diffraction

✍ Scribed by N. Rozlosnik; G. Antal; T. Pusztai; Gy. Faigel


Book ID
117686065
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
323 KB
Volume
4
Category
Article
ISSN
0968-5677

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


X-ray diffraction study of the in-plane
✍ M. Prakash; P. Dutta; J.B. Ketterson; B.M. Abraham πŸ“‚ Article πŸ“… 1984 πŸ› Elsevier Science 🌐 English βš– 403 KB

Using X-ray diffraction at glancing angles, we find that in Langmuir-Blodgett films of lead stearate the lead atoms form plane arrays identical to one set of planes in a bulk crystal, but with little correlation between the planes. The resultin system of twodimensional layers is similar in its stati