✦ LIBER ✦

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

✍ Scribed by Asadchikov, Victor E. ;Duparré, Angela ;Jakobs, Stefan ;Karabekov, Albert Yu. ;Kozhevnikov, Igor V. ;Krivonosov, Yury S.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Roughness analysis of optical films and

✍ C. Ruppe; A. Duparré 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 347 KB

Particulars of studying the roughness of

✍ M. M. Barysheva; Yu. A. Vainer; B. A. Gribkov; M. V. Zorina; A. E. Pestov; D. N. 📂 Article 📅 2011 🏛 Allerton Press Inc 🌐 English ⚖ 277 KB

Wide angle X-ray scattering and atomic f

✍ A Jabłońska; A Burian; A.M Burian; R Coratger 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 278 KB

Structural investigations of TiO2:Tb thi

✍ D. Kaczmarek; J. Domaradzki; D. Wojcieszak; R. Wasielewski; A. Borkowska; E.L. P 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 685 KB

Atomic force microscopy and X-ray diffra

✍ K. Temst; M.J. Van Bael; D.G. de Groot; N.J. Koeman; R.P. Griessen; B. Wuyts; C. 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 165 KB

Grazing incidence X-ray diffraction and

✍ Valmor R Mastelaro; Cesar R Foschini; José A Varela 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 825 KB