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Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy

✍ Scribed by D. Kaczmarek; J. Domaradzki; D. Wojcieszak; R. Wasielewski; A. Borkowska; E.L. Prociow; A. Ciszewski

No coin nor oath required. For personal study only.

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