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Environmental degradation of YBa2Cu3O7 − x thin films. Analysis by atomic force microscopy

✍ Scribed by G. Watson; S.A. Holt; R.-P. Zhao; A. Katsaros; N. Savvides; S. Myhra

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
760 KB
Volume
243
Category
Article
ISSN
0921-4534

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