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Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

✍ Scribed by G. Brauer; W. Anwand; F. Eichhorn; W. Skorupa; C. Hofer; C. Teichert; J. Kuriplach; J. Cizek; I. Prochazka; P.G. Coleman; T. Nozawa; A. Kohyama

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 323 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2005.08.096

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