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Investigation of MBE-grown high Tc films by RHEED, atomic force microscopy and X-ray diffraction

✍ Scribed by H.S. Wang; D. Eissler; W. Dietsche; A. Fischer; K. Ploog

Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
356 KB
Volume
127
Category
Article
ISSN
0022-0248

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