Atomic force microscopy (AFM) and X-ray diffraction (XRD) investigations of copper thin films prepared by dc magnetron sputtering technique

✍ Scribed by Kah-Yoong Chan; Bee-San Teo

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 627 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/j.mejo.2006.04.008