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Wide angle X-ray scattering and atomic force microscopy studies of amorphous In–Se films

✍ Scribed by A Jabłońska; A Burian; A.M Burian; R Coratger

Book ID: 117146646
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 278 KB
Volume: 326-327
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(03)00386-7

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