The small angle X-ray scattering technique was used to probe structural heterogeneity on the scale of nanometers within Nafion@/[silicon oxide], Nafion@/[ORMOSIL], and Nafion@/[dimethylsiloxane] hybrid membranes. The results of this study reinforced the working hypothesis of morphological template a
โฆ LIBER โฆ
Small angle x-ray and neutron scattering studies of plasma-deposited amorphous silicon-hydrogen films
โ Scribed by A.J. Leadbetter; A.A.M. Rashid; R.M. Richardson; A.F. Wright; J.C. Knights
- Publisher
- Elsevier Science
- Year
- 1980
- Tongue
- English
- Weight
- 955 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0038-1098
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