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A comparative Rutherford backscattering spectrometry and Auger electron spectroscopy depth profile study of Fe-N films

✍ Scribed by H. De Rugy; J.P. Langeron; S. Bouquet; L. Minel; G.I. Grigonov; I.N. Martev

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 80 KB
Volume: 161
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(88)90269-6

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