A comparative study of thin film diffusion measurements in metallic glasses by Rutherford backscattering spectrometry and Auger electron spectroscopy

✍ Scribed by S.K. Sharma; S. Banerjee; Kuldeep; Animesh K. Jain

• Publisher: Elsevier Science
• Year: 1988
• Tongue: English
• Weight: 173 KB
• Volume: 164
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(88)90105-8